Photon scanning tunneling microscope in combination with a force microscope

The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected sim...

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Veröffentlicht in:	Journal of applied physics 1994-02, Vol.75 (3), p.1254-1257
Hauptverfasser:	Moers, M. H. P., Tack, R. G., van Hulst, N. F., Bölger, B.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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