Photon scanning tunneling microscope in combination with a force microscope

The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected sim...

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Veröffentlicht in:Journal of applied physics 1994-02, Vol.75 (3), p.1254-1257
Hauptverfasser: Moers, M. H. P., Tack, R. G., van Hulst, N. F., Bölger, B.
Format: Artikel
Sprache:eng
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Zusammenfassung:The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir–Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based on edge steepness), which is well below the diffraction limit.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.356428