Photon scanning tunneling microscope in combination with a force microscope
The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected sim...
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Veröffentlicht in: | Journal of applied physics 1994-02, Vol.75 (3), p.1254-1257 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir–Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based on edge steepness), which is well below the diffraction limit. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.356428 |