Finite-size scaling behavior of ferromagnetic thin films

We have used molecular-beam epitaxy to grow high-quality pseudomorphic Ni and Co1Ni9 films on Cu(001). From temperature-dependent surface magneto-optic Kerr effect measurements of these films, we have determined the finite-size scaling behavior of the Curie temperature of ultrathin films for a thick...

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Veröffentlicht in:Journal of applied physics 1993-05, Vol.73 (10), p.6760-6762
Hauptverfasser: HUANG, F, MANKEY, G. J, KIEF, M. T, WILLIS, R. F
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Sprache:eng
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Zusammenfassung:We have used molecular-beam epitaxy to grow high-quality pseudomorphic Ni and Co1Ni9 films on Cu(001). From temperature-dependent surface magneto-optic Kerr effect measurements of these films, we have determined the finite-size scaling behavior of the Curie temperature of ultrathin films for a thickness range of n=2.5–16 monolayers (ML). The film thickness dependent Curie temperature for each of these ferromagnetic thin-film systems, TC(n), is described by a finite-size scaling formula: [TC(∞) − TC(n)]/TC(n) = [(n − n′)/n0]−1/ν, where TC(∞) is the bulk Curie temperature, n0=2.5±0.5 ML for Co films and 3.5±0.4 ML for Ni and Co1Ni9 films is the microscopic length scale, and ν=0.76±0.08 is the bulk correlation length exponent. An interesting result is that TC(n) extrapolates to zero in the single mononolayer limit, n′=1.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.352477