Imaging ellipsometry of graphene

Imaging ellipsometry of graphene

Imaging ellipsometry studies of graphene on SiO 2 / Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical...

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Veröffentlicht in:Applied physics letters 2010-12, Vol.97 (23), p.231901-231901-3
Hauptverfasser: Wurstbauer, Ulrich, Röling, Christian, Wurstbauer, Ursula, Wegscheider, Werner, Vaupel, Matthias, Thiesen, Peter H., Weiss, Dieter
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container_end_page 231901-3
container_issue 23
container_start_page 231901
container_title Applied physics letters
container_volume 97
creator Wurstbauer, Ulrich
Röling, Christian
Wurstbauer, Ursula
Wegscheider, Werner
Vaupel, Matthias
Thiesen, Peter H.
Weiss, Dieter
description Imaging ellipsometry studies of graphene on SiO 2 / Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene's optical properties can be investigated.
doi_str_mv 10.1063/1.3524226
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title Imaging ellipsometry of graphene
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