Imaging ellipsometry of graphene
Imaging ellipsometry studies of graphene on SiO 2 / Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2010-12, Vol.97 (23), p.231901-231901-3 |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Imaging ellipsometry studies of graphene on
SiO
2
/
Si
and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene's optical properties can be investigated. |
---|---|
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.3524226 |