Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits
Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1....
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2010-08, Vol.97 (7) |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | 7 |
container_start_page | |
container_title | Applied physics letters |
container_volume | 97 |
creator | Yabuta, Hisato Kaji, Nobuyuki Hayashi, Ryo Kumomi, Hideya Nomura, Kenji Kamiya, Toshio Hirano, Masahiro Hosono, Hideo |
description | Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1. Incorporation of excess oxygen to SnO channel layers did not generate holes but did electrons, which in turn led to n-type operation. This result is explained by transformation to a local SnO2-like structure and finally to SnO2. We propose a simple method to fabricate complimentary circuits by simultaneous selective formation of p- and n-channel TFTs. |
doi_str_mv | 10.1063/1.3478213 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_3478213</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_3478213</sourcerecordid><originalsourceid>FETCH-LOGICAL-c339t-a2eb5a45be254601c7f9c0828e785808ab6c08b375e2b85986a29f1d837c4f563</originalsourceid><addsrcrecordid>eNotkM1KAzEYRYMoWKsL3yBbF6lJvsnPLKWoFQpdVNdDJpPUyMxkSFK0b--IXV0OXC6Xg9A9oytGJTyyFVRKcwYXaMGoUgQY05doQSkFImvBrtFNzl8zCg6wQG4_HUtxKYwH7GMaTAlxxNHjiZTT5PB-3OHyGUbiQz_gksyYQy4xZTzXDr3JGZf4bVKH40_oHLZxmPowuLGYdMI2JHsMJd-iK2_67O7OuUQfL8_v6w3Z7l7f1k9bYgHqQgx3rTCVaB0XlaTMKl9bqrl2SgtNtWnljC0o4XirRa2l4bVnnQZlKy8kLNHD_65NMefkfDOlMMxPGkabPz8Na85-4Bd5Llkl</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Yabuta, Hisato ; Kaji, Nobuyuki ; Hayashi, Ryo ; Kumomi, Hideya ; Nomura, Kenji ; Kamiya, Toshio ; Hirano, Masahiro ; Hosono, Hideo</creator><creatorcontrib>Yabuta, Hisato ; Kaji, Nobuyuki ; Hayashi, Ryo ; Kumomi, Hideya ; Nomura, Kenji ; Kamiya, Toshio ; Hirano, Masahiro ; Hosono, Hideo</creatorcontrib><description>Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1. Incorporation of excess oxygen to SnO channel layers did not generate holes but did electrons, which in turn led to n-type operation. This result is explained by transformation to a local SnO2-like structure and finally to SnO2. We propose a simple method to fabricate complimentary circuits by simultaneous selective formation of p- and n-channel TFTs.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3478213</identifier><language>eng</language><ispartof>Applied physics letters, 2010-08, Vol.97 (7)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c339t-a2eb5a45be254601c7f9c0828e785808ab6c08b375e2b85986a29f1d837c4f563</citedby><cites>FETCH-LOGICAL-c339t-a2eb5a45be254601c7f9c0828e785808ab6c08b375e2b85986a29f1d837c4f563</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Yabuta, Hisato</creatorcontrib><creatorcontrib>Kaji, Nobuyuki</creatorcontrib><creatorcontrib>Hayashi, Ryo</creatorcontrib><creatorcontrib>Kumomi, Hideya</creatorcontrib><creatorcontrib>Nomura, Kenji</creatorcontrib><creatorcontrib>Kamiya, Toshio</creatorcontrib><creatorcontrib>Hirano, Masahiro</creatorcontrib><creatorcontrib>Hosono, Hideo</creatorcontrib><title>Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits</title><title>Applied physics letters</title><description>Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1. Incorporation of excess oxygen to SnO channel layers did not generate holes but did electrons, which in turn led to n-type operation. This result is explained by transformation to a local SnO2-like structure and finally to SnO2. We propose a simple method to fabricate complimentary circuits by simultaneous selective formation of p- and n-channel TFTs.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNotkM1KAzEYRYMoWKsL3yBbF6lJvsnPLKWoFQpdVNdDJpPUyMxkSFK0b--IXV0OXC6Xg9A9oytGJTyyFVRKcwYXaMGoUgQY05doQSkFImvBrtFNzl8zCg6wQG4_HUtxKYwH7GMaTAlxxNHjiZTT5PB-3OHyGUbiQz_gksyYQy4xZTzXDr3JGZf4bVKH40_oHLZxmPowuLGYdMI2JHsMJd-iK2_67O7OuUQfL8_v6w3Z7l7f1k9bYgHqQgx3rTCVaB0XlaTMKl9bqrl2SgtNtWnljC0o4XirRa2l4bVnnQZlKy8kLNHD_65NMefkfDOlMMxPGkabPz8Na85-4Bd5Llkl</recordid><startdate>20100816</startdate><enddate>20100816</enddate><creator>Yabuta, Hisato</creator><creator>Kaji, Nobuyuki</creator><creator>Hayashi, Ryo</creator><creator>Kumomi, Hideya</creator><creator>Nomura, Kenji</creator><creator>Kamiya, Toshio</creator><creator>Hirano, Masahiro</creator><creator>Hosono, Hideo</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20100816</creationdate><title>Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits</title><author>Yabuta, Hisato ; Kaji, Nobuyuki ; Hayashi, Ryo ; Kumomi, Hideya ; Nomura, Kenji ; Kamiya, Toshio ; Hirano, Masahiro ; Hosono, Hideo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c339t-a2eb5a45be254601c7f9c0828e785808ab6c08b375e2b85986a29f1d837c4f563</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yabuta, Hisato</creatorcontrib><creatorcontrib>Kaji, Nobuyuki</creatorcontrib><creatorcontrib>Hayashi, Ryo</creatorcontrib><creatorcontrib>Kumomi, Hideya</creatorcontrib><creatorcontrib>Nomura, Kenji</creatorcontrib><creatorcontrib>Kamiya, Toshio</creatorcontrib><creatorcontrib>Hirano, Masahiro</creatorcontrib><creatorcontrib>Hosono, Hideo</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yabuta, Hisato</au><au>Kaji, Nobuyuki</au><au>Hayashi, Ryo</au><au>Kumomi, Hideya</au><au>Nomura, Kenji</au><au>Kamiya, Toshio</au><au>Hirano, Masahiro</au><au>Hosono, Hideo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits</atitle><jtitle>Applied physics letters</jtitle><date>2010-08-16</date><risdate>2010</risdate><volume>97</volume><issue>7</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1. Incorporation of excess oxygen to SnO channel layers did not generate holes but did electrons, which in turn led to n-type operation. This result is explained by transformation to a local SnO2-like structure and finally to SnO2. We propose a simple method to fabricate complimentary circuits by simultaneous selective formation of p- and n-channel TFTs.</abstract><doi>10.1063/1.3478213</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-6951 |
ispartof | Applied physics letters, 2010-08, Vol.97 (7) |
issn | 0003-6951 1077-3118 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_3478213 |
source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
title | Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T03%3A56%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sputtering%20formation%20of%20p-type%20SnO%20thin-film%20transistors%20on%20glass%20toward%20oxide%20complimentary%20circuits&rft.jtitle=Applied%20physics%20letters&rft.au=Yabuta,%20Hisato&rft.date=2010-08-16&rft.volume=97&rft.issue=7&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.3478213&rft_dat=%3Ccrossref%3E10_1063_1_3478213%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |