Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits

Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1....

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Veröffentlicht in:Applied physics letters 2010-08, Vol.97 (7)
Hauptverfasser: Yabuta, Hisato, Kaji, Nobuyuki, Hayashi, Ryo, Kumomi, Hideya, Nomura, Kenji, Kamiya, Toshio, Hirano, Masahiro, Hosono, Hideo
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container_issue 7
container_start_page
container_title Applied physics letters
container_volume 97
creator Yabuta, Hisato
Kaji, Nobuyuki
Hayashi, Ryo
Kumomi, Hideya
Nomura, Kenji
Kamiya, Toshio
Hirano, Masahiro
Hosono, Hideo
description Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1. Incorporation of excess oxygen to SnO channel layers did not generate holes but did electrons, which in turn led to n-type operation. This result is explained by transformation to a local SnO2-like structure and finally to SnO2. We propose a simple method to fabricate complimentary circuits by simultaneous selective formation of p- and n-channel TFTs.
doi_str_mv 10.1063/1.3478213
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title Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits
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