Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits

Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1....

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Veröffentlicht in:Applied physics letters 2010-08, Vol.97 (7)
Hauptverfasser: Yabuta, Hisato, Kaji, Nobuyuki, Hayashi, Ryo, Kumomi, Hideya, Nomura, Kenji, Kamiya, Toshio, Hirano, Masahiro, Hosono, Hideo
Format: Artikel
Sprache:eng
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Zusammenfassung:Thin film transistors (TFTs) using polycrystalline tin oxides (SnO–SnO2) channels were formed on glass by a conventional sputtering method and subsequent annealing treatments. SnO-channel TFTs showed p-type operation with on/off current ratios of ∼102 and field-effect mobilities of 0.24 cm2 V−1 s−1. Incorporation of excess oxygen to SnO channel layers did not generate holes but did electrons, which in turn led to n-type operation. This result is explained by transformation to a local SnO2-like structure and finally to SnO2. We propose a simple method to fabricate complimentary circuits by simultaneous selective formation of p- and n-channel TFTs.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3478213