GaAs multiple-quantum-well reflector modulators with 4:1 contrast ratios on Si
Considerable modulation ratios are achieved for GaAs multiple-quantum-well reflector modulators grown on Si by inserting an AlAs/AlGaAs dielectric mirror into the device structure. Modulation ratios of up to 4:1 is attained as the external bias voltage is increased to 9 V and the 1C-1HH exciton abso...
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Veröffentlicht in: | Journal of applied physics 1991, Vol.69 (1), p.534-536 |
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creator | SALVADOR, A ADOMI, K KISHINO, K ÜNLÜ, M. S MORKOC, H |
description | Considerable modulation ratios are achieved for GaAs multiple-quantum-well reflector modulators grown on Si by inserting an AlAs/AlGaAs dielectric mirror into the device structure. Modulation ratios of up to 4:1 is attained as the external bias voltage is increased to 9 V and the 1C-1HH exciton absorption peak undergoes quantum-confirmed Stark shift. Measurements also indicate that cavity effects arising from the front surface reflection and that of the imbedded dielectric mirror strongly modify the reflectivity spectra. |
doi_str_mv | 10.1063/1.347702 |
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fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_347702</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>5280826</sourcerecordid><originalsourceid>FETCH-LOGICAL-c256t-9020ba9475792478a7212cdb2ab285fbe4969ce2a9f27c1ddc5422d2d0a3ce373</originalsourceid><addsrcrecordid>eNo9kEFLwzAYhoMoOKfgT8jBg5fM5EvTJN7GcFMYelDP5WuaYiVtZ5Iy_PdOJp7e9_Dw8vIQci34QvBS3omFLLTmcEJmghvLtFL8lMw4B8GM1facXKT0ybkQRtoZed7gMtF-CrnbBc--Jhzy1LO9D4FG3wbv8hhpPzZTwENLdN_lD1rcC-rGIUdMmUbM3ZjoONDX7pKctRiSv_rLOXlfP7ytHtn2ZfO0Wm6ZA1VmZjnwGm2hlbZQaIMaBLimBqzBqLb2hS2t84C2Be1E0zhVADTQcJTOSy3n5Pa46-KY0uFotYtdj_G7Erz69VCJ6ujhgN4c0R0mh6GNOLgu_fMKDDdQyh97J1wQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>GaAs multiple-quantum-well reflector modulators with 4:1 contrast ratios on Si</title><source>AIP Digital Archive</source><creator>SALVADOR, A ; ADOMI, K ; KISHINO, K ; ÜNLÜ, M. S ; MORKOC, H</creator><creatorcontrib>SALVADOR, A ; ADOMI, K ; KISHINO, K ; ÜNLÜ, M. S ; MORKOC, H</creatorcontrib><description>Considerable modulation ratios are achieved for GaAs multiple-quantum-well reflector modulators grown on Si by inserting an AlAs/AlGaAs dielectric mirror into the device structure. Modulation ratios of up to 4:1 is attained as the external bias voltage is increased to 9 V and the 1C-1HH exciton absorption peak undergoes quantum-confirmed Stark shift. Measurements also indicate that cavity effects arising from the front surface reflection and that of the imbedded dielectric mirror strongly modify the reflectivity spectra.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.347702</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>Applied sciences ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology</subject><ispartof>Journal of applied physics, 1991, Vol.69 (1), p.534-536</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c256t-9020ba9475792478a7212cdb2ab285fbe4969ce2a9f27c1ddc5422d2d0a3ce373</citedby><cites>FETCH-LOGICAL-c256t-9020ba9475792478a7212cdb2ab285fbe4969ce2a9f27c1ddc5422d2d0a3ce373</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4010,27900,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5280826$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>SALVADOR, A</creatorcontrib><creatorcontrib>ADOMI, K</creatorcontrib><creatorcontrib>KISHINO, K</creatorcontrib><creatorcontrib>ÜNLÜ, M. S</creatorcontrib><creatorcontrib>MORKOC, H</creatorcontrib><title>GaAs multiple-quantum-well reflector modulators with 4:1 contrast ratios on Si</title><title>Journal of applied physics</title><description>Considerable modulation ratios are achieved for GaAs multiple-quantum-well reflector modulators grown on Si by inserting an AlAs/AlGaAs dielectric mirror into the device structure. Modulation ratios of up to 4:1 is attained as the external bias voltage is increased to 9 V and the 1C-1HH exciton absorption peak undergoes quantum-confirmed Stark shift. Measurements also indicate that cavity effects arising from the front surface reflection and that of the imbedded dielectric mirror strongly modify the reflectivity spectra.</description><subject>Applied sciences</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNo9kEFLwzAYhoMoOKfgT8jBg5fM5EvTJN7GcFMYelDP5WuaYiVtZ5Iy_PdOJp7e9_Dw8vIQci34QvBS3omFLLTmcEJmghvLtFL8lMw4B8GM1facXKT0ybkQRtoZed7gMtF-CrnbBc--Jhzy1LO9D4FG3wbv8hhpPzZTwENLdN_lD1rcC-rGIUdMmUbM3ZjoONDX7pKctRiSv_rLOXlfP7ytHtn2ZfO0Wm6ZA1VmZjnwGm2hlbZQaIMaBLimBqzBqLb2hS2t84C2Be1E0zhVADTQcJTOSy3n5Pa46-KY0uFotYtdj_G7Erz69VCJ6ujhgN4c0R0mh6GNOLgu_fMKDDdQyh97J1wQ</recordid><startdate>1991</startdate><enddate>1991</enddate><creator>SALVADOR, A</creator><creator>ADOMI, K</creator><creator>KISHINO, K</creator><creator>ÜNLÜ, M. S</creator><creator>MORKOC, H</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1991</creationdate><title>GaAs multiple-quantum-well reflector modulators with 4:1 contrast ratios on Si</title><author>SALVADOR, A ; ADOMI, K ; KISHINO, K ; ÜNLÜ, M. S ; MORKOC, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c256t-9020ba9475792478a7212cdb2ab285fbe4969ce2a9f27c1ddc5422d2d0a3ce373</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Applied sciences</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SALVADOR, A</creatorcontrib><creatorcontrib>ADOMI, K</creatorcontrib><creatorcontrib>KISHINO, K</creatorcontrib><creatorcontrib>ÜNLÜ, M. S</creatorcontrib><creatorcontrib>MORKOC, H</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SALVADOR, A</au><au>ADOMI, K</au><au>KISHINO, K</au><au>ÜNLÜ, M. S</au><au>MORKOC, H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>GaAs multiple-quantum-well reflector modulators with 4:1 contrast ratios on Si</atitle><jtitle>Journal of applied physics</jtitle><date>1991</date><risdate>1991</risdate><volume>69</volume><issue>1</issue><spage>534</spage><epage>536</epage><pages>534-536</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>Considerable modulation ratios are achieved for GaAs multiple-quantum-well reflector modulators grown on Si by inserting an AlAs/AlGaAs dielectric mirror into the device structure. Modulation ratios of up to 4:1 is attained as the external bias voltage is increased to 9 V and the 1C-1HH exciton absorption peak undergoes quantum-confirmed Stark shift. Measurements also indicate that cavity effects arising from the front surface reflection and that of the imbedded dielectric mirror strongly modify the reflectivity spectra.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.347702</doi><tpages>3</tpages></addata></record> |
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subjects | Applied sciences Electric, optical and optoelectronic circuits Electronics Exact sciences and technology |
title | GaAs multiple-quantum-well reflector modulators with 4:1 contrast ratios on Si |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T08%3A04%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=GaAs%20multiple-quantum-well%20reflector%20modulators%20with%204:1%20contrast%20ratios%20on%20Si&rft.jtitle=Journal%20of%20applied%20physics&rft.au=SALVADOR,%20A&rft.date=1991&rft.volume=69&rft.issue=1&rft.spage=534&rft.epage=536&rft.pages=534-536&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.347702&rft_dat=%3Cpascalfrancis_cross%3E5280826%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |