Epitaxial growth and magnetic properties of Fe16N2 films with high saturation magnetic flux density (invited)
Fe-N films with thicknesses of 70–1000 Å were deposited by MBE onto Fe films which were epitaxially grown onto GaAs(100) substrates. Without the Fe layer, epitaxially grown Fe-N films could not be obtained due to a reaction between Fe-N and GaAs. TEM observations and x-ray diffraction patterns showe...
Gespeichert in:
Veröffentlicht in: | Journal of applied physics 1990-05, Vol.67 (9), p.5126-5130 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Fe-N films with thicknesses of 70–1000 Å were deposited by MBE onto Fe films which were epitaxially grown onto GaAs(100) substrates. Without the Fe layer, epitaxially grown Fe-N films could not be obtained due to a reaction between Fe-N and GaAs. TEM observations and x-ray diffraction patterns showed that the epitaxially grown Fe-N films consist of Fe16N2 and Fe, and that crystal orientation is Fe16N2 (001)//Fe(110). It was found that the saturation magnetic flux density (Bs) increases as the thickness of the Fe-N films decreases. This is because the volume ratio of Fe16N2 in the Fe-N films increases with decreasing Fe-N film thickness. The maximum value for Bs is 2.66 T, and the volume ratio is 85%. These results indicate that Fe16N2 has a high saturation magnetic flux density of 2.8–3.0 T. |
---|---|
ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.344689 |