Electrical characteristics of Au/p-AlSb metal-insulator-semiconductor Schottky diodes
Metal-insulator-semiconductor Schottky barrier diodes have been prepared on p-type bulk AlSb by evaporating gold on a chemically etched (100) AlSb surface. The existence of an oxide-rich interfacial layer between gold and AlSb of ∼70 Å thickness was shown by means of secondary ion mass spectrometry...
Gespeichert in:
Veröffentlicht in: | Journal of applied physics 1989-06, Vol.65 (12), p.4924-4927 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 4927 |
---|---|
container_issue | 12 |
container_start_page | 4924 |
container_title | Journal of applied physics |
container_volume | 65 |
creator | SHATHA SADIQ JOULLIE, A |
description | Metal-insulator-semiconductor Schottky barrier diodes have been prepared on p-type bulk AlSb by evaporating gold on a chemically etched (100) AlSb surface. The existence of an oxide-rich interfacial layer between gold and AlSb of ∼70 Å thickness was shown by means of secondary ion mass spectrometry analysis. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics were measured. The barrier height qφBp(0) obtained from the Richardson plot log(Is/T2) vs (1/nT) is 0.71 eV. The 1/C2-vs-V plot was not a straight line. From the ideality factor at room temperature (n=1.4) and the intercept voltage V0 of the 1/C2-vs-V curve (V0=1.2 V), a density Ds of interface states was evaluated around 5×1011 cm−2 eV−1. |
doi_str_mv | 10.1063/1.343208 |
format | Article |
fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_343208</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>19709754</sourcerecordid><originalsourceid>FETCH-LOGICAL-c257t-f4664e7f14ed6bddf19578f4a398ba07a7798c076dd9a447f370daa567436c073</originalsourceid><addsrcrecordid>eNpFkE1LAzEYhIMoWKvgT9iL4CXtmya7b3IspX5AwUPteXmbDxrddkuSHvrvXangaZjhYWCGsUcBEwGNnIqJVHIG-oqNBGjDsa7hmo0AZoJrg-aW3eX8BSCElmbENsvO25Kipa6yO0pki08xl2hz1Ydqfpoe-bxbb6u9L9TxeMinjkqfePb7aPuDO9nBVWu760v5Plcu9s7ne3YTqMv-4U_HbPOy_Fy88dXH6_tivuJ2VmPhQTWN8hiE8q7ZOheEqVEHRdLoLQESotEWsHHOkFIYJIIjqhtUshlyOWbPl16b-pyTD-0xxT2lcyug_b2jFe3ljgF9uqBHysPYkOhgY_7nDYLBWskfd0lfjQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Electrical characteristics of Au/p-AlSb metal-insulator-semiconductor Schottky diodes</title><source>AIP Digital Archive</source><creator>SHATHA SADIQ ; JOULLIE, A</creator><creatorcontrib>SHATHA SADIQ ; JOULLIE, A</creatorcontrib><description>Metal-insulator-semiconductor Schottky barrier diodes have been prepared on p-type bulk AlSb by evaporating gold on a chemically etched (100) AlSb surface. The existence of an oxide-rich interfacial layer between gold and AlSb of ∼70 Å thickness was shown by means of secondary ion mass spectrometry analysis. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics were measured. The barrier height qφBp(0) obtained from the Richardson plot log(Is/T2) vs (1/nT) is 0.71 eV. The 1/C2-vs-V plot was not a straight line. From the ideality factor at room temperature (n=1.4) and the intercept voltage V0 of the 1/C2-vs-V curve (V0=1.2 V), a density Ds of interface states was evaluated around 5×1011 cm−2 eV−1.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.343208</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>Applied sciences ; Diodes ; Electronics ; Exact sciences and technology ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Journal of applied physics, 1989-06, Vol.65 (12), p.4924-4927</ispartof><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c257t-f4664e7f14ed6bddf19578f4a398ba07a7798c076dd9a447f370daa567436c073</citedby><cites>FETCH-LOGICAL-c257t-f4664e7f14ed6bddf19578f4a398ba07a7798c076dd9a447f370daa567436c073</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19709754$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>SHATHA SADIQ</creatorcontrib><creatorcontrib>JOULLIE, A</creatorcontrib><title>Electrical characteristics of Au/p-AlSb metal-insulator-semiconductor Schottky diodes</title><title>Journal of applied physics</title><description>Metal-insulator-semiconductor Schottky barrier diodes have been prepared on p-type bulk AlSb by evaporating gold on a chemically etched (100) AlSb surface. The existence of an oxide-rich interfacial layer between gold and AlSb of ∼70 Å thickness was shown by means of secondary ion mass spectrometry analysis. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics were measured. The barrier height qφBp(0) obtained from the Richardson plot log(Is/T2) vs (1/nT) is 0.71 eV. The 1/C2-vs-V plot was not a straight line. From the ideality factor at room temperature (n=1.4) and the intercept voltage V0 of the 1/C2-vs-V curve (V0=1.2 V), a density Ds of interface states was evaluated around 5×1011 cm−2 eV−1.</description><subject>Applied sciences</subject><subject>Diodes</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1989</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEYhIMoWKvgT9iL4CXtmya7b3IspX5AwUPteXmbDxrddkuSHvrvXangaZjhYWCGsUcBEwGNnIqJVHIG-oqNBGjDsa7hmo0AZoJrg-aW3eX8BSCElmbENsvO25Kipa6yO0pki08xl2hz1Ydqfpoe-bxbb6u9L9TxeMinjkqfePb7aPuDO9nBVWu760v5Plcu9s7ne3YTqMv-4U_HbPOy_Fy88dXH6_tivuJ2VmPhQTWN8hiE8q7ZOheEqVEHRdLoLQESotEWsHHOkFIYJIIjqhtUshlyOWbPl16b-pyTD-0xxT2lcyug_b2jFe3ljgF9uqBHysPYkOhgY_7nDYLBWskfd0lfjQ</recordid><startdate>19890615</startdate><enddate>19890615</enddate><creator>SHATHA SADIQ</creator><creator>JOULLIE, A</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19890615</creationdate><title>Electrical characteristics of Au/p-AlSb metal-insulator-semiconductor Schottky diodes</title><author>SHATHA SADIQ ; JOULLIE, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c257t-f4664e7f14ed6bddf19578f4a398ba07a7798c076dd9a447f370daa567436c073</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1989</creationdate><topic>Applied sciences</topic><topic>Diodes</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SHATHA SADIQ</creatorcontrib><creatorcontrib>JOULLIE, A</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SHATHA SADIQ</au><au>JOULLIE, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrical characteristics of Au/p-AlSb metal-insulator-semiconductor Schottky diodes</atitle><jtitle>Journal of applied physics</jtitle><date>1989-06-15</date><risdate>1989</risdate><volume>65</volume><issue>12</issue><spage>4924</spage><epage>4927</epage><pages>4924-4927</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>Metal-insulator-semiconductor Schottky barrier diodes have been prepared on p-type bulk AlSb by evaporating gold on a chemically etched (100) AlSb surface. The existence of an oxide-rich interfacial layer between gold and AlSb of ∼70 Å thickness was shown by means of secondary ion mass spectrometry analysis. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics were measured. The barrier height qφBp(0) obtained from the Richardson plot log(Is/T2) vs (1/nT) is 0.71 eV. The 1/C2-vs-V plot was not a straight line. From the ideality factor at room temperature (n=1.4) and the intercept voltage V0 of the 1/C2-vs-V curve (V0=1.2 V), a density Ds of interface states was evaluated around 5×1011 cm−2 eV−1.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.343208</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 1989-06, Vol.65 (12), p.4924-4927 |
issn | 0021-8979 1089-7550 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_343208 |
source | AIP Digital Archive |
subjects | Applied sciences Diodes Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Electrical characteristics of Au/p-AlSb metal-insulator-semiconductor Schottky diodes |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T01%3A25%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electrical%20characteristics%20of%20Au/p-AlSb%20metal-insulator-semiconductor%20Schottky%20diodes&rft.jtitle=Journal%20of%20applied%20physics&rft.au=SHATHA%20SADIQ&rft.date=1989-06-15&rft.volume=65&rft.issue=12&rft.spage=4924&rft.epage=4927&rft.pages=4924-4927&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.343208&rft_dat=%3Cpascalfrancis_cross%3E19709754%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |