Charge sensitive infrared phototransistor for 45 μ m wavelength
The detection wavelength of charge-sensitive infrared phototransistors (CSIPs), originally developed for 15 μ m wavelength radiation, is expanded to longer wavelengths of ∼ 45 μ m . The CSIPs are fabricated on GaAs/AlGaAs crystals with bilayer two-dimensional electron gas. Photoresponse at targe...
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Veröffentlicht in: | Journal of applied physics 2010-05, Vol.107 (9), p.094508-094508-4 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The detection wavelength of charge-sensitive infrared phototransistors (CSIPs), originally developed for
15
μ
m
wavelength radiation, is expanded to longer wavelengths of
∼
45
μ
m
. The CSIPs are fabricated on GaAs/AlGaAs crystals with bilayer two-dimensional electron gas. Photoresponse at targeted wavelengths is confirmed. Low quantum efficiency of photoresponse, on the order of
10
−
4
, has been ascribed to electron traps (Al-O complex) contained in an AlGaAs barrier layer. Several possible approaches for improving the detector performance are suggested. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.3406255 |