Photoluminescence linewidth systematics for semiconductor quantum well structures with graded interface composition profile

Photoluminescence linewidth systematics for the case of semiconductor quantum well structures with a graded interface composition profile are studied within a model which attributes the linewidth to alloy disorder and alloy composition fluctuation effects. Results are presented for two specific type...

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Veröffentlicht in:Journal of applied physics 1988-01, Vol.63 (2), p.578-580
Hauptverfasser: OGALE, S. B, MADHUKAR, A, CHO, N. M
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Sprache:eng
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