Microfields in stroboscopic voltage measurements via electron emisson. II: Effects on electron dynamics

In this article, the transit-time and cross-talk effects occurring in voltage measurement via electron emission are analyzed as a function of geometry, extraction fields, electron start energies, and rise times of the actual input signals. The investigation was performed to obtain information about the maximum achievable time resolution and the disturbance of measured signals by cross-talk effects in corresponding contactless measurement techniques like photoemissive sampling and electron-beam probing. The field distribution above the sample was assumed as being two-dimensional, and the influence of space-charge effects neglected. A strong correspondence to the purely geometry-dependent response function of the potential energy, analyzed in Part I [J. Appl. Phys. 62, 1553 (1987)], is established.