Forward tunneling current in GaN-based blue light-emitting diodes
Forward tunneling current in InGaN/GaN multiquantum-well blue light-emitting diodes grown on sapphire substrate was studied by temperature-variable current-voltage ( I - V ) measurement. All semilog I - V curves obtained in the temperature range from 100 to 300 K exhibit two successive linearly depe...
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Veröffentlicht in: | Applied physics letters 2010-02, Vol.96 (8), p.083504-083504-3 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Forward tunneling current in InGaN/GaN multiquantum-well blue light-emitting diodes grown on sapphire substrate was studied by temperature-variable current-voltage
(
I
-
V
)
measurement. All semilog
I
-
V
curves obtained in the temperature range from 100 to 300 K exhibit two successive linearly dependent regions at low forward bias. The corresponding slopes appear to be insensitive to temperature, which indicates a dominant defect-assisted tunneling process. It is found that the tunneling current varies approximately as a function of
∼
exp
(
−
β
E
g
+
λ
e
V
)
, where
β
and
λ
are constants independent of temperature and voltage. The temperature- and voltage-dependence of forward tunneling current are explained by thermally induced band gap shrinkage and bias-induced route change of diagonal tunneling, respectively. The likely tunneling entities involved in the forward tunneling process are also discussed. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.3327332 |