CEMS characterization of ion-implanted bubble garnets

Conversion-electron Mössbauer spectroscopy (CEMS) applied to the study of the implanted region of garnet bubble films is described; both the advantages and limitations of this technique are discussed. After comparing some earlier work, CEMS results on annealed and etched bubble films are presented. The hyperfine parameters provide information on the paramagnetic phase present, the depth profile, the damage to the superexchange coupling, and the stress effects.