Charge-exchange neutral-atom filling of ion diodes: Its effect on diode performance and A - K shorting

We present a model, supported by experimental evidence, showing how high-density charge-exchange neutral atoms (

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Veröffentlicht in:J. Appl. Phys.; (United States) 1981-04, Vol.52 (4), p.3004-3011
Hauptverfasser: Prono, D. S., Ishizuka, H., Lee, E. P., Stallard, B. W., Turner, W. C.
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container_issue 4
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container_title J. Appl. Phys.; (United States)
container_volume 52
creator Prono, D. S.
Ishizuka, H.
Lee, E. P.
Stallard, B. W.
Turner, W. C.
description We present a model, supported by experimental evidence, showing how high-density charge-exchange neutral atoms (
doi_str_mv 10.1063/1.329045
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C.</creatorcontrib><creatorcontrib>Lawrence Livermore National Laboratory, Livermore, California 94550</creatorcontrib><title>Charge-exchange neutral-atom filling of ion diodes: Its effect on diode performance and A - K shorting</title><title>J. Appl. Phys.; (United States)</title><description>We present a model, supported by experimental evidence, showing how high-density charge-exchange neutral atoms (&lt;10 keV) are created in a partially ionized anode plasma and flow into an ion-diode, anode-cathode (A-K) gap. The buildup of the neutral atoms in the A-K gap and their ionization can cause early A-K shorting which limits high-power and/or long-pulse, ion-diode operation. Ways to avoid the charge-exchange phenomena are mentioned. The ability to produce large-pulsed fluxes of energetic neutrals may have unique applications of its own. For example, high rep-rate spark gaps could benefit from the reduced gas load of an injected short pulse of high-density neutral atoms. 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S.</creatorcontrib><creatorcontrib>Ishizuka, H.</creatorcontrib><creatorcontrib>Lee, E. P.</creatorcontrib><creatorcontrib>Stallard, B. W.</creatorcontrib><creatorcontrib>Turner, W. C.</creatorcontrib><creatorcontrib>Lawrence Livermore National Laboratory, Livermore, California 94550</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>J. Appl. Phys.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Prono, D. S.</au><au>Ishizuka, H.</au><au>Lee, E. P.</au><au>Stallard, B. W.</au><au>Turner, W. C.</au><aucorp>Lawrence Livermore National Laboratory, Livermore, California 94550</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Charge-exchange neutral-atom filling of ion diodes: Its effect on diode performance and A - K shorting</atitle><jtitle>J. Appl. 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Also discussed is the possibility of using an ion-diode geometry to fill a spark-gap cavity with neutrals and then initiate total volume breakdown by ion-impact ionization, thereby avoiding inductive electron filaments.</abstract><cop>United States</cop><doi>10.1063/1.329045</doi><tpages>8</tpages></addata></record>
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subjects 640301 - Atomic, Molecular & Chemical Physics- Beams & their Reactions
ANODES
ATOMS
CATHODES
CHARGE DENSITY
CHARGE EXCHANGE
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DIODE TUBES
ELECTRODES
ELECTRON TUBES
ENERGY RANGE
ION SOURCES
IONIZATION
KEV RANGE
MATHEMATICAL MODELS
PLASMA
PULSES
title Charge-exchange neutral-atom filling of ion diodes: Its effect on diode performance and A - K shorting
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