High-temperature conductance loss dominated defect level in h-BN: Experiments and first principles calculations
The dielectric properties of hexagonal boron nitride are investigated in detail. The permittivities hold extremely low values ranging from room temperature to 1500 ° C , however, the dielectric loss tangents increase rapidly above 1000 ° C . At 1500 ° C , the dielectric loss tangent is 20 times more...
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Veröffentlicht in: | Journal of applied physics 2009-04, Vol.105 (7), p.076103-076103-3 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The dielectric properties of hexagonal boron nitride are investigated in detail. The permittivities hold extremely low values ranging from room temperature to
1500
°
C
, however, the dielectric loss tangents increase rapidly above
1000
°
C
. At
1500
°
C
, the dielectric loss tangent is 20 times more than that at room temperature. The first principles calculations show that the boron vacancy
(
V
B
)
that gives an acceptor energy level near the valence band presents the lowest ionization energy in the investigated defects, and the calculated
V
B
ionization energy agrees with the experimental value. It indicates that the rapid increase in dielectric loss tangents at high temperature is contributed by electrical conductivity produced by
V
B
ionization under thermal excitation. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.3086388 |