High-temperature conductance loss dominated defect level in h-BN: Experiments and first principles calculations

The dielectric properties of hexagonal boron nitride are investigated in detail. The permittivities hold extremely low values ranging from room temperature to 1500 ° C , however, the dielectric loss tangents increase rapidly above 1000 ° C . At 1500 ° C , the dielectric loss tangent is 20 times more...

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Veröffentlicht in:Journal of applied physics 2009-04, Vol.105 (7), p.076103-076103-3
Hauptverfasser: Hou, Zhi-Ling, Cao, Mao-Sheng, Yuan, Jie, Fang, Xiao-Yong, Shi, Xiao-Ling
Format: Artikel
Sprache:eng
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Zusammenfassung:The dielectric properties of hexagonal boron nitride are investigated in detail. The permittivities hold extremely low values ranging from room temperature to 1500 ° C , however, the dielectric loss tangents increase rapidly above 1000 ° C . At 1500 ° C , the dielectric loss tangent is 20 times more than that at room temperature. The first principles calculations show that the boron vacancy ( V B ) that gives an acceptor energy level near the valence band presents the lowest ionization energy in the investigated defects, and the calculated V B ionization energy agrees with the experimental value. It indicates that the rapid increase in dielectric loss tangents at high temperature is contributed by electrical conductivity produced by V B ionization under thermal excitation.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3086388