Growth and characterization of stable SrO-terminated SrTiO3 surfaces

A simple technique for the growth of SrO-terminated SrTiO3 surfaces is reported. High quality SrTiO3 epitaxial films were grown by reflection high energy electron diffraction assisted pulsed laser deposition on suitably prepared NdGaO3 (110) substrates. The surface properties, analyzed within a grow...

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Veröffentlicht in:Applied physics letters 2009-01, Vol.94 (2)
Hauptverfasser: Radovic, M., Lampis, N., Granozio, F. Miletto, Perna, P., Ristic, Z., Salluzzo, M., Schlepütz, C. M., Scotti di Uccio, U.
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Sprache:eng
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Zusammenfassung:A simple technique for the growth of SrO-terminated SrTiO3 surfaces is reported. High quality SrTiO3 epitaxial films were grown by reflection high energy electron diffraction assisted pulsed laser deposition on suitably prepared NdGaO3 (110) substrates. The surface properties, analyzed within a growth/characterization multichamber ultrahigh vacuum system by photoemission spectroscopy performed on the core-level spectra of Sr and Ti, low energy electron diffraction-, scanning tunneling-, and atomic force microscopy, are fully consistent with a single Sr oxide termination. The availability of such high quality SrO-terminated SrTiO3 surfaces is of major importance for the controlled growth of oxide epilayers and interfaces.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3052606