X-ray in-plane scattering investigation of GaN nanorods

An x-ray method is described for the structure characterization of semiordered GaN nanorods. In contrast to other works based on synchrotron radiation, the method uses a standard x-ray laboratory equipment so that it is suitable for a rapid characterization of the nanorods in a technological laborat...

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Veröffentlicht in:	Journal of applied physics 2008-11, Vol.104 (10), p.103504-103504-5
Hauptverfasser:	Horák, L., Holý, V., Staddon, C. R., Farley, N. R. S., Novikov, S. V., Campion, R. P., Foxon, C. T.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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