Nanoscale charge transport measurements using a double-tip scanning tunneling microscope

We demonstrate the ability of a double-tip scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM) to perform charge transport measurements on the nanoscale. The STM tips serve as electric probes that can be precisely positioned relative to the surface nanostructures u...

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Veröffentlicht in:	Journal of applied physics 2008-11, Vol.104 (9), p.094307-094307-6
Hauptverfasser:	Jaschinsky, Philipp, Wensorra, Jakob, Lepsa, Mihail Ion, Mysliveček, Josef, Voigtländer, Bert
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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