Low strain sensitivity of the dielectric property of pyrochlore Bi–Zn–Nb–O films

Thermal strain sensitivity of the dielectric property was investigated for (111)-textured polycrystalline Bi–Zn–Nb–O films. Cubic pyrochlore films with similar crystallinity and the degree of the orientation were obtained on various substrates, and their 111 lattice spacing monotonously increased with the increasing thermal expansion coefficient of the substrates. The dielectric constant at 0kV∕cm and its tunability were almost independent of the residual strain, unlike highly sensitive (Ba0.5Sr0.5)TiO3 films. This strain independent characteristic of the dielectric property of pyrochlore Bi–Zn–Nb–O film is a big advantage in actual applications.