Nitric acid pretreatment for the passivation of boron emitters for n -type base silicon solar cells

We have developed a simple method to passivate industrially produced boron-doped emitters for n -type base silicon solar cells using an ultrathin ( ∼ 1.5 nm ) silicon dioxide layer between the silicon emitter and the silicon nitride antireflection coating film. This ultrathin oxide is grown at room...

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Veröffentlicht in:Applied physics letters 2008-02, Vol.92 (6), p.063510-063510-3
Hauptverfasser: Mihailetchi, Valentin D., Komatsu, Yuji, Geerligs, L. J.
Format: Artikel
Sprache:eng
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Zusammenfassung:We have developed a simple method to passivate industrially produced boron-doped emitters for n -type base silicon solar cells using an ultrathin ( ∼ 1.5 nm ) silicon dioxide layer between the silicon emitter and the silicon nitride antireflection coating film. This ultrathin oxide is grown at room temperature by soaking the silicon wafers in a solution of nitric acid prior to the deposition of the silicon nitride antireflection coating film. The n -type solar cells processed in such a way demonstrate a conversion efficiency enhancement of more than 2% absolute over the solar cells passivated without the silicon dioxide layer.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2870202