Structural and dielectric properties of epitaxial Sm2O3 thin films

Epitaxial Sm2O3 thin films were deposited on (001) SrTiO3 substrates by pulsed laser deposition. The structural and dielectric properties were investigated. Microstructural studies by x-ray diffraction and transmission electron microscopy showed that the Sm2O3 thin films have a cubic structure and a...

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Veröffentlicht in:Applied physics letters 2008-02, Vol.92 (6)
Hauptverfasser: Yang, H., Wang, H., Luo, H. M., Feldmann, D. M., Dowden, P. C., DePaula, R. F., Jia, Q. X.
Format: Artikel
Sprache:eng
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Zusammenfassung:Epitaxial Sm2O3 thin films were deposited on (001) SrTiO3 substrates by pulsed laser deposition. The structural and dielectric properties were investigated. Microstructural studies by x-ray diffraction and transmission electron microscopy showed that the Sm2O3 thin films have a cubic structure and an epitaxial relationship of (004)Sm2O3∥(002)SrTiO3 and [440]Sm2O3∥[200]SrTiO3. A high dielectric constant of 30.5 was found, which can be attributed to the cubic structure and the high crystalline quality and shows a potential application of epitaxial Sm2O3 thin film for high-k material.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2842416