The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer
The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate...
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Veröffentlicht in: | Applied physics letters 2007-10, Vol.91 (15), p.152107-152107-3 |
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container_title | Applied physics letters |
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creator | Cho, Kwanghee Cho, Sang Wan Whang, Chung-Nam Jeong, Kwangho Kang, Seong Jun Yi, Yeonjin |
description | The electronic structure of tris(8-hydroquinoline) aluminum
(
Al
q
3
)
/rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using
in situ
ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and
Al
q
3
, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene. |
doi_str_mv | 10.1063/1.2798588 |
format | Article |
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(
Al
q
3
)
/rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using
in situ
ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and
Al
q
3
, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2798588</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2007-10, Vol.91 (15), p.152107-152107-3</ispartof><rights>2007 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</citedby><cites>FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.2798588$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Cho, Kwanghee</creatorcontrib><creatorcontrib>Cho, Sang Wan</creatorcontrib><creatorcontrib>Whang, Chung-Nam</creatorcontrib><creatorcontrib>Jeong, Kwangho</creatorcontrib><creatorcontrib>Kang, Seong Jun</creatorcontrib><creatorcontrib>Yi, Yeonjin</creatorcontrib><title>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</title><title>Applied physics letters</title><description>The electronic structure of tris(8-hydroquinoline) aluminum
(
Al
q
3
)
/rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using
in situ
ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and
Al
q
3
, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp1kM9KxDAQh4MouK4efINcPXQ3abZNehFk8R8seFnPIU0mbZa2WdK4ug_ge9vSBS86l5mBjx8zH0K3lCwoydmSLlJeiEyIMzSjhPOEUSrO0YwQwpK8yOgluur73bBmKWMz9L2tAfvgKtdhbzE0oGPwHXbdbpjcOLX74A_QQhfxCIVKdU7jxlV1TKB1MbquwgYOTkOPP12ssfrF_JczsAwfZYAO_opv1BHCNbqwqunh5tTn6P3pcbt-STZvz6_rh02iU7GKichUZnhGlQBecGVXorDcaGOYsKVNtSWqLK0teK5pbrQu84JmZqiSKKqZYnN0N-Xq4Ps-gJX74FoVjpISOfqTVJ78Dez9xPbaRTXe-j88SJSTROmtnL5kP_a0fVk</recordid><startdate>20071008</startdate><enddate>20071008</enddate><creator>Cho, Kwanghee</creator><creator>Cho, Sang Wan</creator><creator>Whang, Chung-Nam</creator><creator>Jeong, Kwangho</creator><creator>Kang, Seong Jun</creator><creator>Yi, Yeonjin</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20071008</creationdate><title>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</title><author>Cho, Kwanghee ; Cho, Sang Wan ; Whang, Chung-Nam ; Jeong, Kwangho ; Kang, Seong Jun ; Yi, Yeonjin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cho, Kwanghee</creatorcontrib><creatorcontrib>Cho, Sang Wan</creatorcontrib><creatorcontrib>Whang, Chung-Nam</creatorcontrib><creatorcontrib>Jeong, Kwangho</creatorcontrib><creatorcontrib>Kang, Seong Jun</creatorcontrib><creatorcontrib>Yi, Yeonjin</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cho, Kwanghee</au><au>Cho, Sang Wan</au><au>Whang, Chung-Nam</au><au>Jeong, Kwangho</au><au>Kang, Seong Jun</au><au>Yi, Yeonjin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</atitle><jtitle>Applied physics letters</jtitle><date>2007-10-08</date><risdate>2007</risdate><volume>91</volume><issue>15</issue><spage>152107</spage><epage>152107-3</epage><pages>152107-152107-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The electronic structure of tris(8-hydroquinoline) aluminum
(
Al
q
3
)
/rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using
in situ
ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and
Al
q
3
, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2798588</doi></addata></record> |
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source | AIP Journals Complete; AIP Digital Archive |
title | The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer |
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