The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer

The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate...

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Veröffentlicht in:Applied physics letters 2007-10, Vol.91 (15), p.152107-152107-3
Hauptverfasser: Cho, Kwanghee, Cho, Sang Wan, Whang, Chung-Nam, Jeong, Kwangho, Kang, Seong Jun, Yi, Yeonjin
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container_issue 15
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container_title Applied physics letters
container_volume 91
creator Cho, Kwanghee
Cho, Sang Wan
Whang, Chung-Nam
Jeong, Kwangho
Kang, Seong Jun
Yi, Yeonjin
description The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q 3 , the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.
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fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_2798588</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</originalsourceid><addsrcrecordid>eNp1kM9KxDAQh4MouK4efINcPXQ3abZNehFk8R8seFnPIU0mbZa2WdK4ug_ge9vSBS86l5mBjx8zH0K3lCwoydmSLlJeiEyIMzSjhPOEUSrO0YwQwpK8yOgluur73bBmKWMz9L2tAfvgKtdhbzE0oGPwHXbdbpjcOLX74A_QQhfxCIVKdU7jxlV1TKB1MbquwgYOTkOPP12ssfrF_JczsAwfZYAO_opv1BHCNbqwqunh5tTn6P3pcbt-STZvz6_rh02iU7GKichUZnhGlQBecGVXorDcaGOYsKVNtSWqLK0teK5pbrQu84JmZqiSKKqZYnN0N-Xq4Ps-gJX74FoVjpISOfqTVJ78Dez9xPbaRTXe-j88SJSTROmtnL5kP_a0fVk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Cho, Kwanghee ; Cho, Sang Wan ; Whang, Chung-Nam ; Jeong, Kwangho ; Kang, Seong Jun ; Yi, Yeonjin</creator><creatorcontrib>Cho, Kwanghee ; Cho, Sang Wan ; Whang, Chung-Nam ; Jeong, Kwangho ; Kang, Seong Jun ; Yi, Yeonjin</creatorcontrib><description>The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q 3 , the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2798588</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2007-10, Vol.91 (15), p.152107-152107-3</ispartof><rights>2007 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</citedby><cites>FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.2798588$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Cho, Kwanghee</creatorcontrib><creatorcontrib>Cho, Sang Wan</creatorcontrib><creatorcontrib>Whang, Chung-Nam</creatorcontrib><creatorcontrib>Jeong, Kwangho</creatorcontrib><creatorcontrib>Kang, Seong Jun</creatorcontrib><creatorcontrib>Yi, Yeonjin</creatorcontrib><title>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</title><title>Applied physics letters</title><description>The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q 3 , the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp1kM9KxDAQh4MouK4efINcPXQ3abZNehFk8R8seFnPIU0mbZa2WdK4ug_ge9vSBS86l5mBjx8zH0K3lCwoydmSLlJeiEyIMzSjhPOEUSrO0YwQwpK8yOgluur73bBmKWMz9L2tAfvgKtdhbzE0oGPwHXbdbpjcOLX74A_QQhfxCIVKdU7jxlV1TKB1MbquwgYOTkOPP12ssfrF_JczsAwfZYAO_opv1BHCNbqwqunh5tTn6P3pcbt-STZvz6_rh02iU7GKichUZnhGlQBecGVXorDcaGOYsKVNtSWqLK0teK5pbrQu84JmZqiSKKqZYnN0N-Xq4Ps-gJX74FoVjpISOfqTVJ78Dez9xPbaRTXe-j88SJSTROmtnL5kP_a0fVk</recordid><startdate>20071008</startdate><enddate>20071008</enddate><creator>Cho, Kwanghee</creator><creator>Cho, Sang Wan</creator><creator>Whang, Chung-Nam</creator><creator>Jeong, Kwangho</creator><creator>Kang, Seong Jun</creator><creator>Yi, Yeonjin</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20071008</creationdate><title>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</title><author>Cho, Kwanghee ; Cho, Sang Wan ; Whang, Chung-Nam ; Jeong, Kwangho ; Kang, Seong Jun ; Yi, Yeonjin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c284t-85a5d751a8e797af489f7dcdd38fbf2cf0abbff976c16dccb6915ddddb0a1c3a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cho, Kwanghee</creatorcontrib><creatorcontrib>Cho, Sang Wan</creatorcontrib><creatorcontrib>Whang, Chung-Nam</creatorcontrib><creatorcontrib>Jeong, Kwangho</creatorcontrib><creatorcontrib>Kang, Seong Jun</creatorcontrib><creatorcontrib>Yi, Yeonjin</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cho, Kwanghee</au><au>Cho, Sang Wan</au><au>Whang, Chung-Nam</au><au>Jeong, Kwangho</au><au>Kang, Seong Jun</au><au>Yi, Yeonjin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer</atitle><jtitle>Applied physics letters</jtitle><date>2007-10-08</date><risdate>2007</risdate><volume>91</volume><issue>15</issue><spage>152107</spage><epage>152107-3</epage><pages>152107-152107-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q 3 , the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2798588</doi></addata></record>
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title The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T12%3A35%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20origin%20of%20electron%20injection%20improvement%20in%20organic%20light-emitting%20devices%20with%20an%20organic%20oxide/rubrene%20electron%20injection%20layer&rft.jtitle=Applied%20physics%20letters&rft.au=Cho,%20Kwanghee&rft.date=2007-10-08&rft.volume=91&rft.issue=15&rft.spage=152107&rft.epage=152107-3&rft.pages=152107-152107-3&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.2798588&rft_dat=%3Cscitation_cross%3Eapl%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true