The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer

The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate...

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Veröffentlicht in:Applied physics letters 2007-10, Vol.91 (15), p.152107-152107-3
Hauptverfasser: Cho, Kwanghee, Cho, Sang Wan, Whang, Chung-Nam, Jeong, Kwangho, Kang, Seong Jun, Yi, Yeonjin
Format: Artikel
Sprache:eng
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Zusammenfassung:The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q 3 , the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2798588