The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer
The electronic structure of tris(8-hydroquinoline) aluminum ( Al q 3 ) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate...
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Veröffentlicht in: | Applied physics letters 2007-10, Vol.91 (15), p.152107-152107-3 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The electronic structure of tris(8-hydroquinoline) aluminum
(
Al
q
3
)
/rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using
in situ
ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and
Al
q
3
, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2798588 |