Derivation of length of carbon nanotube responsible for electron emission from field emission characteristics
A method for deriving the length of carbon nanotube (CNT) in field emission arrays is proposed. Unlike the direct method of observation using a microscope, this method gathers information from functional measurements. Electron emission characteristics of CNT's printed on glass substrate were me...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2007-05, Vol.90 (20), p.203107-203107-3 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A method for deriving the length of carbon nanotube (CNT) in field emission arrays is proposed. Unlike the direct method of observation using a microscope, this method gathers information from functional measurements. Electron emission characteristics of CNT's printed on glass substrate were measured in a diode configuration. The macroscopic part of the voltage field conversion factor
β
was obtained from the relationship between the slope and intercept of the Fowler-Nordheim plot, and also from modeling of the electrodes. The length of the CNT was derived comparing the two values for
β
. The estimated length of the CNT agrees with direct measurements. |
---|---|
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2740199 |