Derivation of length of carbon nanotube responsible for electron emission from field emission characteristics

A method for deriving the length of carbon nanotube (CNT) in field emission arrays is proposed. Unlike the direct method of observation using a microscope, this method gathers information from functional measurements. Electron emission characteristics of CNT's printed on glass substrate were me...

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Veröffentlicht in:Applied physics letters 2007-05, Vol.90 (20), p.203107-203107-3
Hauptverfasser: Gotoh, Y., Kawamura, Y., Niiya, T., Ishibashi, T., Nicolaescu, D., Tsuji, H., Ishikawa, J., Hosono, A., Nakata, S., Okuda, S.
Format: Artikel
Sprache:eng
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Zusammenfassung:A method for deriving the length of carbon nanotube (CNT) in field emission arrays is proposed. Unlike the direct method of observation using a microscope, this method gathers information from functional measurements. Electron emission characteristics of CNT's printed on glass substrate were measured in a diode configuration. The macroscopic part of the voltage field conversion factor β was obtained from the relationship between the slope and intercept of the Fowler-Nordheim plot, and also from modeling of the electrodes. The length of the CNT was derived comparing the two values for β . The estimated length of the CNT agrees with direct measurements.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2740199