Effects of octahedral thickness variance on the temperature coefficient of resonant frequency of the B -site deficient hexagonal perovskites

The temperature coefficient of resonant frequency ( τ f ) and the structure of B -site deficient hexagonal perovskite materials have been assembled with the intention of understanding the structure-property relationship. Based on the refined structure data, the authors proposed a structure-related p...

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Veröffentlicht in:Applied physics letters 2007-04, Vol.90 (14), p.142908-142908-3
Hauptverfasser: Zhao, Fei, Yue, Zhenxing, Pei, Jing, Gui, Zhilun, Li, Longtu
Format: Artikel
Sprache:eng
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Zusammenfassung:The temperature coefficient of resonant frequency ( τ f ) and the structure of B -site deficient hexagonal perovskite materials have been assembled with the intention of understanding the structure-property relationship. Based on the refined structure data, the authors proposed a structure-related parameter v to characterize the octahedral thickness variance. Therefore, a correlation between the value of τ f and the octahedral thickness variance has been established. This approach illustrates that the octahedral thickness variance plays an important role in the value and sign of τ f . It also gives a satisfying explanation for the variation of τ f in the Ba 5 Nb 4 O 15 - Ba 5 Ta 4 O 15 system.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2719219