Temperature-dependent magnetic resonance force microscopy studies of a thin Permalloy film

We used magnetic resonance force microscopy (MRFM) to study a 50 nm thick continuous Permalloy film. We mechanically measured the ferromagnetic resonance signal in the temperature range between 10 and 70 K in the presence of a static magnetic field applied normal to the surface of the film. The meas...

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Veröffentlicht in:Journal of applied physics 2007-04, Vol.101 (7), p.074905-074905-4
Hauptverfasser: Nazaretski, E., Thompson, J. D., Movshovich, R., Zalalutdinov, M., Baldwin, J. W., Houston, B., Mewes, T., Pelekhov, D. V., Wigen, P., Hammel, P. C.
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Sprache:eng
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Zusammenfassung:We used magnetic resonance force microscopy (MRFM) to study a 50 nm thick continuous Permalloy film. We mechanically measured the ferromagnetic resonance signal in the temperature range between 10 and 70 K in the presence of a static magnetic field applied normal to the surface of the film. The measurements show a decrease of the ferromagnetic resonance field with increasing temperature. We attribute this behavior to the temperature-dependent changes of the saturation magnetization. Our experiments demonstrate the potential of MRFM to perform quantitative ferromagnetic resonance measurements as a function of temperature.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.2715761