Temperature-dependent magnetic resonance force microscopy studies of a thin Permalloy film
We used magnetic resonance force microscopy (MRFM) to study a 50 nm thick continuous Permalloy film. We mechanically measured the ferromagnetic resonance signal in the temperature range between 10 and 70 K in the presence of a static magnetic field applied normal to the surface of the film. The meas...
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Veröffentlicht in: | Journal of applied physics 2007-04, Vol.101 (7), p.074905-074905-4 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We used magnetic resonance force microscopy (MRFM) to study a
50
nm
thick continuous Permalloy film. We mechanically measured the ferromagnetic resonance signal in the temperature range between 10 and
70
K
in the presence of a static magnetic field applied normal to the surface of the film. The measurements show a decrease of the ferromagnetic resonance field with increasing temperature. We attribute this behavior to the temperature-dependent changes of the saturation magnetization. Our experiments demonstrate the potential of MRFM to perform quantitative ferromagnetic resonance measurements as a function of temperature. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.2715761 |