On optical activity of Er3+ ions in Si-rich SiO2 waveguides

Photoluminescence spectroscopy was used to explore the optical activity of Er3+ ions in Si-rich SiO2 waveguides prepared by ion implantation. Measurements were performed for a series of materials characterized by different Si excess levels, Er concentrations, and annealing temperatures. The highest...

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Veröffentlicht in:Applied physics letters 2006-10, Vol.89 (17)
Hauptverfasser: Minissale, S., Gregorkiewicz, T., Forcales, M., Elliman, R. G.
Format: Artikel
Sprache:eng
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Zusammenfassung:Photoluminescence spectroscopy was used to explore the optical activity of Er3+ ions in Si-rich SiO2 waveguides prepared by ion implantation. Measurements were performed for a series of materials characterized by different Si excess levels, Er concentrations, and annealing temperatures. The highest fraction of optically active Er3+ ions which can be efficiently activated by nonresonant pumping was found to be 2.6%. This was realized in a waveguide with an Er concentration of [Er]=1018cm−3 and Si excess of 20%, annealed at 900°C. This optical activity level is insufficient to realize optical gain. It is therefore clear that further material improvement is needed before optical amplification in SiO2:Er matrices sensitized by Si nanocrystals/nanoclusters can be achieved.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2369674