Trap levels in tris(8-hydroxyquinoline) aluminum studied by deep-level optical spectroscopy
We have investigated band gap states in tris(8-hydroxyquinoline) aluminum on fabricated indium tin oxide∕Alq3∕LiF∕Al devices by using a deep-level optical spectroscopy (DLOS) technique. DLOS measurements after double-carrier injection into the Alq3 layer revealed a discrete trap level located at ∼1....
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2006-06, Vol.88 (25) |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | We have investigated band gap states in tris(8-hydroxyquinoline) aluminum on fabricated indium tin oxide∕Alq3∕LiF∕Al devices by using a deep-level optical spectroscopy (DLOS) technique. DLOS measurements after double-carrier injection into the Alq3 layer revealed a discrete trap level located at ∼1.39eV below the lowest unoccupied molecular orbital band. The pronounced 1.39eV level is attributable to an intrinsic nature of Alq3 and can be active as an efficient generation-recombination center that may impact the photophysical properties. Additionally, the effective band gap of the Alq3 layer became narrow from 3.05to2.80eV with increasing double-carrier injection rate. |
---|---|
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2214179 |