Effect of uniaxial stress on excitons in a self-assembled quantum dot

The fine structure of the neutral exciton in a single self-assembled InGaAs quantum dot is investigated under the effect of an applied uniaxial stress. The spectrum of the excitonic Rayleigh scattering was measured in reflectivity using high-resolution laser spectroscopy while the sample was submitt...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2006-05, Vol.88 (20), p.203113-203113-3
Hauptverfasser: Seidl, Stefan, Kroner, Martin, Högele, Alexander, Karrai, Khaled, Warburton, Richard J., Badolato, Antonio, Petroff, Pierre M.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The fine structure of the neutral exciton in a single self-assembled InGaAs quantum dot is investigated under the effect of an applied uniaxial stress. The spectrum of the excitonic Rayleigh scattering was measured in reflectivity using high-resolution laser spectroscopy while the sample was submitted to a tunable uniaxial stress along its [110] crystal axis. We show that using this stretching technique, the quantum dot potential is elastically deformable such that the exciton fine structure splitting can be substantially reduced.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2204843