Magnetoresistance and magnetization switching characteristics of magnetic tunnel junctions with amorphous CoFeSiB single and synthetic antiferromagnet free layers

To obtain low switching field (Hsw) we introduced amorphous ferromagnetic Co70.5Fe4.5Si15B10 single and synthetic antiferromagnet (SAF) free layers in magnetic tunnel junctions (MTJs). The switching characteristics for MTJs with structures Si∕SiO2∕Ta 45/Ru 9.5/IrMn 10/CoFe 7∕AlOx∕CoFeSiB 7 or CoFeSiB (t)∕Ru 1.0/CoFeSiB (7−t)∕Ru 60 (in nanometer) were investigated and compared to MTJs with Co75Fe25 and Ni80Fe20 free layers. CoFeSiB showed a lower saturation magnetization of 560emu∕cm3 and a higher anisotropy constant of 2800erg∕cm3 than CoFe and NiFe, respectively. An exchange coupling energy (Jex) of −0.003erg∕cm2 was observed by inserting a 1.0nm Ru layer in between CoFeSiB layers. In the CoFeSiB single and SAF free layer MTJs, it was found that the size dependence of the Hsw originated from the lower Jex experimentally and by micromagnetic simulation based on the Landau-Lisfschitz-Gilbert equation. The CoFeSiB SAF structures showed lower Hsw than that of NiFe, CoFe, and CoFeSiB single structures. The CoFeSiB SAF structures were proved to be beneficial for the switching characteristics such as reducing the coercivity and increasing the sensitivity in micrometer- to submicrometer-sized elements.