Z-contrast and electron energy loss spectroscopy study of passive layer formation at ferroelectric PbTiO3∕Pt interfaces
Scanning transmission electron microscopy and electron energy loss spectroscopy have been applied to investigate the possible structural origins of ferroelectric polarization degradation at PbTiO3∕Pt interfaces. The microscopic analysis revealed that an amorphous Ti-rich interfacial layer as well as...
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Veröffentlicht in: | Applied physics letters 2005-12, Vol.87 (26) |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Scanning transmission electron microscopy and electron energy loss spectroscopy have been applied to investigate the possible structural origins of ferroelectric polarization degradation at PbTiO3∕Pt interfaces. The microscopic analysis revealed that an amorphous Ti-rich interfacial layer as well as nanometer size precipitates was formed at PbTiO3∕Pt interfaces. The interfacial layer appears to form through decomposition of the PbTiO3 film due to a ferroelectric-electrode reaction during Pt deposition. The formation of the interfacial layer and precipitates could contribute to the polarization degradation typically observed for Pt-electroded PbTiO3-based ferroelectric capacitors. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2144279 |