Z-contrast and electron energy loss spectroscopy study of passive layer formation at ferroelectric PbTiO3∕Pt interfaces

Scanning transmission electron microscopy and electron energy loss spectroscopy have been applied to investigate the possible structural origins of ferroelectric polarization degradation at PbTiO3∕Pt interfaces. The microscopic analysis revealed that an amorphous Ti-rich interfacial layer as well as...

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Veröffentlicht in:Applied physics letters 2005-12, Vol.87 (26)
Hauptverfasser: Fu, L. F., Welz, S. J., Browning, N. D., Kurasawa, M., McIntyre, P. C.
Format: Artikel
Sprache:eng
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Zusammenfassung:Scanning transmission electron microscopy and electron energy loss spectroscopy have been applied to investigate the possible structural origins of ferroelectric polarization degradation at PbTiO3∕Pt interfaces. The microscopic analysis revealed that an amorphous Ti-rich interfacial layer as well as nanometer size precipitates was formed at PbTiO3∕Pt interfaces. The interfacial layer appears to form through decomposition of the PbTiO3 film due to a ferroelectric-electrode reaction during Pt deposition. The formation of the interfacial layer and precipitates could contribute to the polarization degradation typically observed for Pt-electroded PbTiO3-based ferroelectric capacitors.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2144279