Crystallization thermometer for ultralow temperatures with a cooled FET oscillator

The existing methods of measuring pressure in a crystallization thermometer used for measuring ultralow temperatures are analyzed. It is shown that a method based on measuring the resonance frequency of a resonance circuit, which includes a capacitive pressure gauge, can be used to increase measurem...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Low temperature physics (Woodbury, N.Y.) N.Y.), 2005-11, Vol.31 (11), p.998-1001
Hauptverfasser:	Maĭdanov, V. A., Mil’chenko, M. I., Mikhin, N. P., Neoneta, A. S., Polev, A. V., Repin, V. N., Rubets, S. P., Rybalko, A. S., Semenov, S. F., Syrnikov, E. V., Shilin, V. A., Vekhov, E. O.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!