Crystallization thermometer for ultralow temperatures with a cooled FET oscillator

The existing methods of measuring pressure in a crystallization thermometer used for measuring ultralow temperatures are analyzed. It is shown that a method based on measuring the resonance frequency of a resonance circuit, which includes a capacitive pressure gauge, can be used to increase measurement sensitivity and accuracy. A low-temperature FET oscillator is described. This oscillator makes it possible to increase the sensitivity and accuracy of temperature measurements in the range 0.9 mK –1 K by more than an order of magnitude.