Ferroelectric domain structure in epitaxial BiFeO3 films

Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600nm thick epitaxial BiFeO3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reco...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2005-10, Vol.87 (18)
Hauptverfasser: Zavaliche, F., Das, R. R., Kim, D. M., Eom, C. B., Yang, S. Y., Shafer, P., Ramesh, R.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600nm thick epitaxial BiFeO3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2126804