Ferroelectric domain structure in epitaxial BiFeO3 films
Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600nm thick epitaxial BiFeO3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reco...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2005-10, Vol.87 (18) |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600nm thick epitaxial BiFeO3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed. |
---|---|
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2126804 |