High-performance GaN-based light-emitting diode using high-transparency Ni ∕ Au ∕ Al -doped ZnO composite contacts
We report on a high-transparency low-resistance composite contact structure on p - Ga N for light-emitting diode applications. The structure consists of a thin Ni ( 5 nm ) ∕ Au ( 5 nm ) layer overcoated with a sputtered Al-doped ZnO ( 170 nm ) layer. Enhancement in light emission intensity as high a...
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Veröffentlicht in: | Applied physics letters 2005-10, Vol.87 (18), p.181107-181107-3 |
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Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We report on a high-transparency low-resistance composite contact structure on
p
-
Ga
N
for light-emitting diode applications. The structure consists of a thin
Ni
(
5
nm
)
∕
Au
(
5
nm
)
layer overcoated with a sputtered Al-doped ZnO
(
170
nm
)
layer. Enhancement in light emission intensity as high as 74% at
40
mA
and forward operating voltages in the range of
3.36
-
3.48
V
at
20
mA
are obtained for these devices using a two-step thermal annealing process. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2120913 |