Diode calibration of a Langmuir probe system for measurement of electron energy distribution functions in a plasma

Diode calibration of a Langmuir probe system for measurement of electron energy distribution functions in a plasma

It is shown that a simple circuit consisting of a semiconductor diode, a resistor, and a dc voltage source can model a narrow-energy group of electrons in a plasma for the purpose of calibration of a Langmuir probe. The calibration is appropriate when the probe is used for measurement of the electro...

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Veröffentlicht in:Review of scientific instruments 2005-08, Vol.76 (8), p.086105-086105-3
Hauptverfasser: DeJoseph, C. A., Demidov, V. I.
Format: Artikel
Sprache:eng
Schlagworte:
CALIBRATION
ELECTRIC POTENTIAL
ELECTRONS
ENERGY RESOLUTION
ENERGY SPECTRA
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
LANGMUIR PROBE
PLASMA
RESISTORS
SEMICONDUCTOR DIODES
SENSITIVITY
SIGNAL-TO-NOISE RATIO
THERMIONIC DIODES
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Zusammenfassung:It is shown that a simple circuit consisting of a semiconductor diode, a resistor, and a dc voltage source can model a narrow-energy group of electrons in a plasma for the purpose of calibration of a Langmuir probe. The calibration is appropriate when the probe is used for measurement of the electron energy distribution function (EEDF). This simple circuit allows real-time determination of sensitivity, energy resolution, and signal-to-noise ratio for probe measurements of the EEDF.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2006287