High-quality factor optical microcavities using oxide apertured micropillars
An oxide aperture is used to confine optical modes in a micropillar structure. This method overcomes the limitations due to sidewall scattering loss typical in semiconductor etched micropillars. High cavity quality factors ( Q ) up to 48000 are determined by external Fabry-Perot cavity scanning meas...
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| Veröffentlicht in: | Applied physics letters 2005-07, Vol.87 (3), p.031105-031105-3 |
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| Sprache: | eng |
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| container_end_page | 031105-3 |
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| container_issue | 3 |
| container_start_page | 031105 |
| container_title | Applied physics letters |
| container_volume | 87 |
| creator | Stoltz, N. G. Rakher, M. Strauf, S. Badolato, A. Lofgreen, D. D. Petroff, P. M. Coldren, L. A. Bouwmeester, D. |
| description | An oxide aperture is used to confine optical modes in a micropillar structure. This method overcomes the limitations due to sidewall scattering loss typical in semiconductor etched micropillars. High cavity quality factors
(
Q
)
up to 48000 are determined by external Fabry-Perot cavity scanning measurements, a significantly higher value than prior work in III-V etched micropillars. Measured
Q
values and estimated mode volumes correspond to a maximum Purcell factor figure of merit value of 72. |
| doi_str_mv | 10.1063/1.1999843 |
| format | Article |
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(
Q
)
up to 48000 are determined by external Fabry-Perot cavity scanning measurements, a significantly higher value than prior work in III-V etched micropillars. Measured
Q
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(
Q
)
up to 48000 are determined by external Fabry-Perot cavity scanning measurements, a significantly higher value than prior work in III-V etched micropillars. Measured
Q
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(
Q
)
up to 48000 are determined by external Fabry-Perot cavity scanning measurements, a significantly higher value than prior work in III-V etched micropillars. Measured
Q
values and estimated mode volumes correspond to a maximum Purcell factor figure of merit value of 72.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.1999843</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2005-07, Vol.87 (3), p.031105-031105-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_1999843 |
| source | AIP Journals Complete; AIP Digital Archive |
| title | High-quality factor optical microcavities using oxide apertured micropillars |
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