High-quality factor optical microcavities using oxide apertured micropillars
An oxide aperture is used to confine optical modes in a micropillar structure. This method overcomes the limitations due to sidewall scattering loss typical in semiconductor etched micropillars. High cavity quality factors ( Q ) up to 48000 are determined by external Fabry-Perot cavity scanning meas...
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Veröffentlicht in: | Applied physics letters 2005-07, Vol.87 (3), p.031105-031105-3 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | An oxide aperture is used to confine optical modes in a micropillar structure. This method overcomes the limitations due to sidewall scattering loss typical in semiconductor etched micropillars. High cavity quality factors
(
Q
)
up to 48000 are determined by external Fabry-Perot cavity scanning measurements, a significantly higher value than prior work in III-V etched micropillars. Measured
Q
values and estimated mode volumes correspond to a maximum Purcell factor figure of merit value of 72. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.1999843 |