Evidence of ion diffusion at room temperature in microcrystals of the Bi2Sr2CaCu2O8+δ superconductor

We have studied Bi-2212 microcrystals aged at ambient conditions for 40 days. Combined x-ray absorption near edge structure and x-ray fluorescence measurements with micrometer space resolution show both an increase of Cu+ with respect to Cu2+ and an enrichment in Cu vs Bi and Sr cation content near...

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Veröffentlicht in:Applied physics letters 2005-05, Vol.86 (21)
Hauptverfasser: Truccato, M., Lamberti, C., Prestipino, C., Agostino, A.
Format: Artikel
Sprache:eng
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Zusammenfassung:We have studied Bi-2212 microcrystals aged at ambient conditions for 40 days. Combined x-ray absorption near edge structure and x-ray fluorescence measurements with micrometer space resolution show both an increase of Cu+ with respect to Cu2+ and an enrichment in Cu vs Bi and Sr cation content near the sample edges in the b-axis direction. A parallel study on an electrically contacted sample has indirectly detected the O loss, observing both a resistivity increase and an increase in sample thickness near the edges. We conclude that the O outdiffusion along the b axis is accompanied by Cu cation migration in the same direction.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1938251