Compact continuous-wave subterahertz system for inspection applications

We report the use of a compact continuous-wave sub-terahertz system for inspection applications, using electronic generation and detection methods. A combination of a Gunn diode emitter, a Schottky diode detector, and a polyethylene Fresnel lens provides line-scan images at 0.2 m ∕ s with a data acq...

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Veröffentlicht in:Applied physics letters 2005-01, Vol.86 (5), p.054105-054105-3
Hauptverfasser: Karpowicz, Nicholas, Zhong, Hua, Zhang, Cunlin, Lin, Kuang-I, Hwang, Jenn-Shyong, Xu, Jingzhou, Zhang, X.-C.
Format: Artikel
Sprache:eng
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Zusammenfassung:We report the use of a compact continuous-wave sub-terahertz system for inspection applications, using electronic generation and detection methods. A combination of a Gunn diode emitter, a Schottky diode detector, and a polyethylene Fresnel lens provides line-scan images at 0.2 m ∕ s with a data acquisition rate of 512 points ∕ s . Examples of the measurement of NASA's insulating panels and applicability of the technology to other nondestructive testing applications are presented and discussed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1856701