Femtosecond time-resolved dispersion relation of complex nonlinear refractive index in a semiconductor quantum well
We present simultaneous measurement of femtosecond time-resolved nonlinear phase and amplitude changes around the excitonic resonance of the Al Ga As ∕ Ga As quantum well using polarization-division Sagnac interferometer. The nonlinear complex refractive index of the semiconductor material for all-o...
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| Veröffentlicht in: | Applied physics letters 2004-10, Vol.85 (17), p.3678-3680 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | We present simultaneous measurement of femtosecond time-resolved nonlinear phase and amplitude changes around the excitonic resonance of the
Al
Ga
As
∕
Ga
As
quantum well using polarization-division Sagnac interferometer. The nonlinear complex refractive index of the semiconductor material for all-optical devices is successfully determined from directly measured nonlinear phase and amplitude changes. |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| DOI: | 10.1063/1.1808225 |