Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy

Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy

Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown Ga N x As 1 − x ( x = 0.36 % ) sample exhibited two ultrafast transient processes in the t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2004-10, Vol.85 (15), p.3268-3270
Hauptverfasser: Takeuchi, Osamu, Aoyama, Masahiro, Oshima, Ryuji, Okada, Yoshitaka, Oigawa, Haruhiro, Sano, Nobuyuki, Shigekawa, Hidemi, Morita, Ryuji, Yamashita, Mikio
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown Ga N x As 1 − x ( x = 0.36 % ) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653 ± 0.025 and 55.1 ± 5.0 ps . These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1804238