Structure and thickness-dependent lattice parameters of ultrathin epitaxial Pr2O3 films on Si(001)

Structure and thickness-dependent lattice parameters of ultrathin epitaxial Pr2O3 films on Si(001)

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Veröffentlicht in:Applied physics letters 2004-08, Vol.85 (7), p.1229-1231
Hauptverfasser: Schroeder, T., Lee, T.-L., Zegenhagen, J., Wenger, C., Zaumseil, P., Müssig, H.-J.
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container_issue 7
container_start_page 1229
container_title Applied physics letters
container_volume 85
creator Schroeder, T.
Lee, T.-L.
Zegenhagen, J.
Wenger, C.
Zaumseil, P.
Müssig, H.-J.
description
doi_str_mv 10.1063/1.1771465
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title Structure and thickness-dependent lattice parameters of ultrathin epitaxial Pr2O3 films on Si(001)
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