Investigation of structural and ferroelectric properties of pulsed-laser-ablated epitaxial Nd-doped bismuth titanate films

Investigation of structural and ferroelectric properties of pulsed-laser-ablated epitaxial Nd-doped bismuth titanate films

Lanthanide doped bismuth titanate films have been shown to exhibit excellent fatigue resistance and higher remanent polarization than SrBi2Ta2O9 films. In this paper we report on the detailed investigation of structural and ferroelectric properties of Nd-doped Bi4Ti3O12 (BNdT) films grown by pulsed...

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Veröffentlicht in:Journal of applied physics 2004-09, Vol.96 (6), p.3408-3412
Hauptverfasser: Garg, A., Snedden, A., Lightfoot, P., Scott, J. F., Hu, X., Barber, Z. H.
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container_end_page 3412
container_issue 6
container_start_page 3408
container_title Journal of applied physics
container_volume 96
creator Garg, A.
Snedden, A.
Lightfoot, P.
Scott, J. F.
Hu, X.
Barber, Z. H.
description Lanthanide doped bismuth titanate films have been shown to exhibit excellent fatigue resistance and higher remanent polarization than SrBi2Ta2O9 films. In this paper we report on the detailed investigation of structural and ferroelectric properties of Nd-doped Bi4Ti3O12 (BNdT) films grown by pulsed laser ablation. Highly epitaxial 300nm thick (001)-, (118)-, and (104)-oriented BNdT films were deposited on SrRuO3 buffered SrTiO3 substrates of (100), (110), and (111) orientations, respectively. The highest remanent polarization (2Pr) of ∼40μC∕cm2 was observed in the (104)-oriented films at a coercive field of ∼50kV∕cm. Leakage currents of the films were of the order of 10−6−10−5A∕cm2 with (104)-oriented films showing improved behavior. The films showed good fatigue resistance upon bipolar switching up to 109 cycles.
doi_str_mv 10.1063/1.1766097
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title Investigation of structural and ferroelectric properties of pulsed-laser-ablated epitaxial Nd-doped bismuth titanate films
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