Investigation of structural and ferroelectric properties of pulsed-laser-ablated epitaxial Nd-doped bismuth titanate films

Lanthanide doped bismuth titanate films have been shown to exhibit excellent fatigue resistance and higher remanent polarization than SrBi2Ta2O9 films. In this paper we report on the detailed investigation of structural and ferroelectric properties of Nd-doped Bi4Ti3O12 (BNdT) films grown by pulsed...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2004-09, Vol.96 (6), p.3408-3412
Hauptverfasser: Garg, A., Snedden, A., Lightfoot, P., Scott, J. F., Hu, X., Barber, Z. H.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Lanthanide doped bismuth titanate films have been shown to exhibit excellent fatigue resistance and higher remanent polarization than SrBi2Ta2O9 films. In this paper we report on the detailed investigation of structural and ferroelectric properties of Nd-doped Bi4Ti3O12 (BNdT) films grown by pulsed laser ablation. Highly epitaxial 300nm thick (001)-, (118)-, and (104)-oriented BNdT films were deposited on SrRuO3 buffered SrTiO3 substrates of (100), (110), and (111) orientations, respectively. The highest remanent polarization (2Pr) of ∼40μC∕cm2 was observed in the (104)-oriented films at a coercive field of ∼50kV∕cm. Leakage currents of the films were of the order of 10−6−10−5A∕cm2 with (104)-oriented films showing improved behavior. The films showed good fatigue resistance upon bipolar switching up to 109 cycles.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1766097