An Exposure Meter for the Electron Microscope

An Exposure Meter for the Electron Microscope

A simple exposure meter has been developed which measures directly the beam current reaching the fluorescent viewing screen of the electron microscope. By its use, the characteristic curve of a Kodak lantern slide plate has been plotted at constant intensity of electron beam. The value of beam inten...

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Veröffentlicht in:Review of scientific instruments 1951-04, Vol.22 (4), p.231-232
Hauptverfasser: Frei, E. H., Hirshfeld, F. L.
Format: Artikel
Sprache:eng
Schlagworte:
Electrons
Microscopy
Microscopy, Electron
Old Medline
Online-Zugang:Volltext
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Beschreibung
Zusammenfassung:A simple exposure meter has been developed which measures directly the beam current reaching the fluorescent viewing screen of the electron microscope. By its use, the characteristic curve of a Kodak lantern slide plate has been plotted at constant intensity of electron beam. The value of beam intensity given by the exposure meter is confirmed by direct counts of electron tracks in the developed emulsion.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1745897