Noise Measurements in Semiconductors at Very Low Frequencies

The low-frequency noise spectra of germanium and silicon rectifiers have been determined. Two methods were employed: a numerical analysis according to the Wiener-Khintchine relationship, and a frequency translation photo playback method. No evidence of a deviation from a 1/fa(a>1) noise power law was found down to frequencies as low as 6×10−5 cps.