Pulse Height Defect and Energy Dispersion in Semiconductor Detectors

We have calculated the contributions of the atomic (screened Coulombic) scattering process to the pulse height defect and energy dispersion observed when heavy ions expend their energies in semiconductor detectors. Atomic scattering appears to account qualitatively for the pulse height defect observ...

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Veröffentlicht in:	Review of Scientific Instruments (U.S.) 1966-02, Vol.37 (2), p.190-194
Hauptverfasser:	Haines, Eldon L., Whitehead, A. Bruce
Format:	Artikel
Sprache:	eng
Schlagworte:	DEFECTS DETECTION ENERGY GERMANIUM INSTRUMENTATION IONS LOSSES PULSES Radiation Detection SCATTERING SEMICONDUCTORS
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